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PM300

Precise & stable 300mm probing

Features and Benefits

  • Flexible design enables R&D or production use
  • Fine-Glide chuck stage
  • Wide range of SUSS accessories supported
  • Upgrade path available
  • DC and High Frequency configurations

The SUSS PM300 Analytical Probe System is the industry benchmark in manual semiconductor failure analysis and in-process testing.

Its versatility meets a wide range of probing applications from analytical to pilot production, incorporating a round chuck for wafer tests or a square chuck for applications such as Flat Panel Display.

Flexibility in optics and accessories enables system configurations according to actual needs and budget constraints.