SussCal® Professional
RF & Microwave Wafer-Level Calibration Software
Features and Benefits
- The most accurate on-wafer measurements from DC to 110 GHz and beyond
- LRM+™ method for the best one and two-port calibration and RRMT+™ for the most accurate multiport calibration
- Easily calibrate differential and multiport devices with PortMapping™ technology
- Powerful tools for data analysis, verification and measurement
- Intuitive, user-friendly interface
SussCal® Professional is the most advanced, easy-to-use wafer-level calibration software available. It was designed by leading RF and microwave engineers to optimize your wafer-level measurements from DC to 110 GHz and beyond.
The LRM+™ calibration method, the most advanced calibration method for one and two-port setups, and the RRMT+™ calibration method for multiport setups are only available in SussCal Professional. Both methods uniquely calibrate the entire system to the device under test (DUT) for all ports, making sure that you are accurately measuring your device regardless of measurement setup symmetry. Furthermore, the accuracy of these methods has been verified using independent NIST standards.
SussCal Professional software can automate the calibration process in conjunction with a semiautomatic or fully-automated probe system from SUSS. The software handles an unlimited number of calibration substrates and stores their positions in relation to the DUT, eliminating probe crashes and device damage. Powerful tools such as SussView™, the SubstrateNavigator™, PortMapping™ and Calibration Verification increase the simplicity and accuracy of your measurements even further.
