Fully-Automated Probe Systems
SUSS' fully-automated probers are anything but ordinary solutions. Each system is innovative and modular. Our automated wafer probers are tailored to test your devices in ways that other probe system manufacturers cannot. The AP200 is compatible with all SUSS accessories and offers a high-throughput platform for challenging test requirements. The BlueRay™ Probe System is specifically designed to tackle tests where traditional DC measurements aren’t enough, for example when testing optoelectronic (LED), RF (SAW/BAW/FBAR) and MEMS (pressure sensors) devices. The patented Cluster Probe System is the ultimate in innovative production test – up to six, individually-configured prober modules clustered around a central wafer robot.

AP200
Wafer size: ≤ 200mm
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Main Applications: DCM, PT
AP200 BlueRay™
High-Throughput Production Test System
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Wafer size: ≤ 200mm
Main Applications: PT
Cluster Probe System
Cluster Production Test System
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Wafer size: ≤ 200mm
Main Applications: DCM, PT



