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|Z| Probe® Technology

The |Z| Probe® family of RF and microwave wafer probes from SUSS revolutionized the way you test your HF devices. Contacting your device under test (DUT) has never been easier and uses less overtravel than other wafer probes, which means less crashes and a longer probe life. In fact, SUSS guarantees the |Z| Probe will last for over one million (1,000,000) contacts.

To calibrate your probes, SUSS has the powerful SussCal® Calibration Software and the highly-accurate CSR family of calibration substrates.