Optosemiconductor Test
Characterizing light emitting devices requires a combined measurement setup for detecting the light emission (luminous and radiant intensity, spectral distribution and color characteristics) as well as the electrical characterization (I-V characteristics and C-V characteristics).
Combining the probing know-how with the excellence of partners in detecting the smallest photonic radiation, SUSS can offer integrated turnkey test solutions for optoelectronic wafer tests of components such as VCSELS, bar lasers, LEDs and OLEDs as well as photo detectors.
This is achieved by integrating test equipment for electrical characterization from leading vendors such as Keithley and Agilent. Equipment includes special fiber positioning systems for maximum local radiation, integrating spheres, chuck fixtures for laser bar handling as well as the renowned SUSS MicroTec double-side probing systems for testing backside emitting devices.
The whole test environment can be integrated with the ProberBench™ Control System.
SUSS has also teamed up with Instrument Systems, the optical measurement expert, to provide superior, integrated solutions for wafer-level test of optoelectronic devices. One such solution, MultiDie Testing™ Technology, integrates the BlueRay™ Probe System from SUSS with measurement instrumentation from Instrument Systems. With MultiDie Testing Technology, you can achieve throughputs never seen before. This is especially valuable when an entire LED wafer needs to be characterized. You get accurate test results faster, and the devices are not damaged thanks to the precision of the system.
