Manual Alignment Verification System
DSM8 Gen2
Semi-Automated Alignment Verfication System
With the DSM8 Gen2 SUSS MicroTec introduces the semi-automated metrology tool of choice for all emerging front to backside alignment and overlay applications. The verification system is the ideal tool for measuring alignment accuracy on wafers from 2 inch to 200mm.
moreDownloads & Contact
Product Brochure |  | |
 |
二手設備
Contact
Product Finder